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Yann Rotrou
Abstract
Short wavelength thermography with silicium cameras: contribution to radiometric modelling
Yann Rotrou - 13 December 2006
Within the Ecole des Mines d'Albi, the CROMeP laboratory (Centre
de Recherche sur les Outillages, les Matériaux et les Procédés)
develops accurate full-field temperature measurement devices
based on off-the-shelf high-resolution uncooled silicon cameras,
to study for instance the behavior of metallic molds between 400
and 1000°C. The advantages of using such silicon cameras to
perform such measurements are recalled.
In our work, a new approach of the radiometric modeling of such
a system is proposed. Firstly, a more accurate parametric model
is presented, characterized by only one set of parameters,
independent of the integration time. This leads to a shorter and
easier camera calibration procedure and provides a system with
an on-line controlled dynamic range. Secondly, the performances
of the system are evaluated and improved by studying some
disturbing effects. Some of these characterizations have been
done in collaboration with the CIMI (Conception d'Imageurs
Matriciels Intégrés) laboratory. Then CCD and CMOS cameras
performances are compared with these of traditional infrared
cameras.
Finally, an innovative method for 3-D shape, strain and
temperature full-field measurement, using a single camera-based
sensor, is presented.
Keywords :
Thermography, radiative measurement, optronics, modelisation,
image processing
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